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Impact of O-Si-O bond angle fluctuations on the Si-O bond-breakage rate.
Stanislav Tyaginov, Viktor Sverdlov, Ivan A. Starkov, Wolfgang Gös, Tibor Grasser: Impact of O-Si-O bond angle fluctuations on the Si-O bond-breakage rate. Microelectron. Reliab. 49(9-11): 998-1002 (2009)
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Interface traps density-of-states as a vital component for hot-carrier...
Stanislav Tyaginov, Ivan A. Starkov, Oliver Triebl, Johann Cervenka, C. Jungemann, Sara Carniello, Jong Mun Park, Hubert Enichlmair, Markus Karner, Ch. Kernstock, Ehrenfried Seebacher, Rainer...
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An analytical approach for physical modeling of hot-carrier induced degradation.
Stanislav Tyaginov, Ivan A. Starkov, Hubert Enichlmair, C. Jungemann, Jong Mun Park, Ehrenfried Seebacher, R. L. de Orio, Hajdin Ceric, Tibor Grasser: An analytical approach for physical modeling of...
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Origins and implications of increased channel hot carrier variability in...
Ben Kaczer, Jacopo Franco, M. Cho, Tibor Grasser, Philippe J. Roussel, Stanislav Tyaginov, M. Bina, Yannick Wimmer, Luis-Miguel Procel, Lionel Trojman, Felice Crupi, Gregory Pitner, Vamsi Putcha,...
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Comparison of analytic distribution function models for hot-carrier...
Prateek Sharma, Stanislav Tyaginov, Yannick Wimmer, Florian Rudolf, Karl Rupp, Hubert Enichlmair, J. H. Park, Hajdin Ceric, Tibor Grasser: Comparison of analytic distribution function models for...
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A drift-diffusion-based analytic description of the energy distribution...
Prateek Sharma, Stanislav Tyaginov, Stewart E. Rauch, Jacopo Franco, Ben Kaczer, Alexander Makarov, Mikhail I. Vexler, Tibor Grasser: A drift-diffusion-based analytic description of the energy...
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Full (Vg, Vd) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs.
Michiel Vandemaele, Ben Kaczer, Stanislav Tyaginov, Zlatan Stanojevic, Alexander Makarov, Adrian Vaisman Chasin, Erik Bury, Hans Mertens, Dimitri Linten, Guido Groeseneken: Full (Vg, Vd) Bias Space...
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Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs.
Alexander Makarov, Ben Kaczer, Philippe Roussel, Adrian Vaisman Chasin, Alexander Grill, Michiel Vandemaele, Geert Hellings, Al-Moatasem El-Sayed, Tibor Grasser, Dimitri Linten, Stanislav Tyaginov:...
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Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the...
Alexander Makarov, Dimitri Linten, Stanislav Tyaginov, Ben Kaczer, Philippe Roussel, Adrian Vaisman Chasin, Michiel Vandemaele, Geert Hellings, Al-Moatasem El-Sayed, Markus Jech, Tibor Grasser:...
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The Influence of Gate Bias on the Anneal of Hot-Carrier Degradation.
Michiel Vandemaele, Kai-Hsin Chuang, Erik Bury, Stanislav Tyaginov, Guido Groeseneken, Ben Kaczer: The Influence of Gate Bias on the Anneal of Hot-Carrier Degradation. IRPS 2020: 1-7
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A Compact Physics Analytical Model for Hot-Carrier Degradation.
Stanislav Tyaginov, Alexander Grill, Michiel Vandemaele, Tibor Grasser, Geert Hellings, Alexander Makarov, Markus Jech, Dimitri Linten, Ben Kaczer: A Compact Physics Analytical Model for Hot-Carrier...
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Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures.
Alexander Grill, Erik Bury, Jakob Michl, Stanislav Tyaginov, Dimitri Linten, Tibor Grasser, Bertrand Parvais, Ben Kaczer, Michael Waltl, Iuliana P. Radu: Reliability and Variability of Advanced CMOS...
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A BSIM-Based Predictive Hot-Carrier Aging Compact Model.
Yang Xiang, Stanislav Tyaginov, Michiel Vandemaele, Zhicheng Wu, Jacopo Franco, Erik Bury, Brecht Truijen, Bertrand Parvais, Dimitri Linten, Ben Kaczer: A BSIM-Based Predictive Hot-Carrier Aging...
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Physics-based device aging modelling framework for accurate circuit...
Zhicheng Wu, Jacopo Franco, Brecht Truijen, Philippe Roussel, Stanislav Tyaginov, Michiel Vandemaele, Erik Bury, Guido Groeseneken, Dimitri Linten, Ben Kaczer: Physics-based device aging modelling...
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The properties, effect and extraction of localized defect profiles from...
Michiel Vandemaele, Ben Kaczer, Stanislav Tyaginov, Jacopo Franco, Robin Degraeve, Adrian Vaisman Chasin, Zhicheng Wu, Erik Bury, Yang Xiang, Hans Mertens, Guido Groeseneken: The properties, effect and...
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On Superior Hot Carrier Robustness of Dynamically-Doped...
Stanislav Tyaginov, Aryan Afzalian, Alexander Makarov, Alexander Grill, Michiel Vandemaele, Maksim Cherenev, Mikhail I. Vexler, Geert Hellings, Ben Kaczer: On Superior Hot Carrier Robustness of...
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Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k...
Alexander Grill, V. John, Jakob Michl, A. Beckers, Erik Bury, Stanislav Tyaginov, Bertrand Parvais, Adrian Vaisman Chasin, Tibor Grasser, Michael Waltl, Ben Kaczer, Bogdan Govoreanu: Temperature...
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Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and...
Michiel Vandemaele, Ben Kaczer, Stanislav Tyaginov, Erik Bury, Adrian Vaisman Chasin, Jacopo Franco, Alexander Makarov, Hans Mertens, Geert Hellings, Guido Groeseneken: Simulation Comparison of...
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Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier...
Stanislav Tyaginov, Alexander Makarov, Al-Moatasem Bellah El-Sayed, Adrian Vaisman Chasin, Erik Bury, Markus Jech, Michiel Vandemaele, Alexander Grill, An De Keersgieter, Mikhail I. Vexler, Geert...
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Evaluating Forksheet FET Reliability Concerns by Experimental Comparison with...
Erik Bury, Adrian Vaisman Chasin, Ben Kaczer, Michiel Vandemaele, Stanislav Tyaginov, Jacopo Franco, Romain Ritzenthaler, Hans Mertens, Pieter Weckx, N. Horiguchi, Dimitri Linten: Evaluating Forksheet...
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